Switch-Level Fault Simulation and Test Generation for Competing Bridging Faults
نویسندگان
چکیده
This paper investigates the degradation in diagnosability of bridging faults caused by situations of active feedback and logically unresolvable intermediate values under different fault modeling assumptions. The experimental results show that active feedback may reduce the fault coverage by as much as 7% for stuck-at test sets and realistic bridging fault sets. A test generation method for full-custom CMOS networks that maximizes the probability of detecting hard bridging faults is presented.
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